Patent attributes
A 3D measuring system includes a first projector that projects a first line onto an object at a first wavelength, a second projector that projects a second line onto the object at a second wavelength, a first illuminator that emits a third light onto some markers, a second illuminator that emits a fourth light onto some markers, a first camera having a first lens and a first image sensor, a second camera having a second lens and a second image sensor, the first lens operable to pass the first wavelength, block the second wavelength, and pass the third light to a first image sensor, the second lens operable to pass the second wavelength, block the first wavelength, and pass the fourth light. The system further includes one or more processors operable to determine 3D coordinates based on images captured by the first image sensor and the second image sensor.
