US Patent 11930292 Device state monitoring method and apparatus
Patent 11930292 was granted and assigned to Hangzhou Hikvision Digital Technology Co., Ltd. on March, 2024 by the United States Patent and Trademark Office.
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US Patent 11930292 Device state monitoring method and apparatus
The present application provides a method and apparatus for monitoring a device state. The method includes: detecting one or more current values of one or more state parameters; for each state parameter of the one or more state parameters, determining whether the current value of the state parameter changes relative to a recorded value of the state parameter; and reporting the current value of the state parameter to a client through a connection between the present device and the client in response to determining that the current value of the state parameter changes relative to the recorded value of the state parameter.
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