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US Patent 11946969 Multi-die debug stop clock trigger

Patent 11946969 was granted and assigned to Apple (company) on April, 2024 by the United States Patent and Trademark Office.

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Is a
Patent
Patent
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Patent attributes

Patent Applicant
Apple (company)
Apple (company)
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Current Assignee
Apple (company)
Apple (company)
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
119469690
Patent Inventor Names
Charles J. Fleckenstein0
Tal Lazmi0
Ori Isachar0
Date of Patent
April 2, 2024
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Patent Application Number
178805070
Date Filed
August 3, 2022
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Patent Citations
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US Patent 10234505 Clock generation for integrated circuit testing
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US Patent 7266742 Method and apparatus for generating a local scan enable signal to test circuitry in a die
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US Patent 8683265 Debug state machine cross triggering
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US Patent 9037911 Debug state machines and methods of their operation
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US Patent 9720438 Clock switch device and system-on-chip having the same
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US Patent 11422184 Multi-die debug stop clock trigger
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Patent Primary Examiner
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Christine T. Tu
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CPC Code
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G01R 31/31727
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G01R 31/318314
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G01R 31/31705
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G01R 31/31725
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G01R 31/31924
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Patent abstract

Systems, apparatuses, and methods for implementing a multi-die clock stop trigger are described. A computing system includes a plurality of semiconductor dies connected together and sharing a global clock stop trigger signal which is pulled high via a resistor tied to a supply voltage. Each semiconductor die has a clock generation unit which generates local clocks for the die. Each clock generation unit monitors for local clock stop triggers, and if one of the local triggers is detected, the clock generation unit stops local clocks on the die and pulls the global clock stop trigger signal low. When the other clock generation units on the other semiconductor dies detect the global clock stop trigger at the logic low level, these clock generation units also stop their local clocks. Captured data is then retrieved from the computing system for further analysis.

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