Patent attributes
A system for diagnosing an additive manufacturing device is provided. The system includes one or more processors, one or more non-transitory memory modules communicatively coupled to the one or more processors and storing machine-readable instructions. The machine-readable instructions, when executed, cause the one or more processors to: determine parameters associated with at least one subsystem of the additive manufacturing device, the parameters being related to a build generated by the additive manufacturing device; compare the parameters with threshold values; and determine a failure mode, among a plurality of failure modes, associated with a subsystem of the at least one subsystem of the additive manufacturing device based on the comparison of the parameters with the threshold values.
