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US Patent 11955454 Wafer bonding apparatus and method
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Patent
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Date Filed
February 25, 2022
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Date of Patent
April 9, 2024
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Patent Application Number
17681161
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Patent Citations
US Patent 7998833 Method for bonding wafers
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US Patent 8489225 Wafer alignment system with optical coherence tomography
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US Patent 9466538 Method to achieve ultra-high chip-to-chip alignment accuracy for wafer-to-wafer bonding process
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US Patent 10636688 Method for alignment, process tool and method for wafer-level alignment
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US Patent 9646860 Alignment systems and wafer bonding systems and methods
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US Patent 11367712 Semiconductor device and manufacturing method thereof
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US Patent 7371663 Three dimensional IC device and alignment methods of IC device substrates
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US Patent 7442476 Method and system for 3D alignment in wafer scale integration
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Patent Inventor Names
Mengyong Liu
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Wu Liu
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Guoliang Chen
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Yang Liu
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
11955454
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Patent Primary Examiner
David A Zarneke
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CPC Code
H01L 2021/60075
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H01L 24/80
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H01L 2223/54426
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H01L 23/544
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H01L 21/681
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H01L 2224/80121
0
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