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US Patent 11961276 Linear structure extraction device, method, program, and learned model

Patent 11961276 was granted and assigned to Fujifilm on April, 2024 by the United States Patent and Trademark Office.

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Patent
Patent
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Patent attributes

Patent Applicant
Fujifilm
Fujifilm
0
Current Assignee
Fujifilm
Fujifilm
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
119612760
Patent Inventor Names
Yoshiro Kitamura0
Akimichi Ichinose0
Date of Patent
April 16, 2024
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Patent Application Number
174775470
Date Filed
September 17, 2021
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Patent Citations
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US Patent 9858496 Object detection and classification in images
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US Patent 10198671 Dense captioning with joint interference and visual context
0
Patent Primary Examiner
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Leon Flores
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Patent abstract

Provided are a linear structure extraction device, a method, a program, and a learned model which can detect a linear structure in an image. A linear structure extraction device according to an embodiment of the present disclosure includes a learning model that is learned to receive an input of the image and output, as a prediction result, one or more element points which constitute the linear structure from the image, in which the learning model includes a first processing module that receives the image and generates a feature map representing a feature amount of the image by convolution processing, and a second processing module that calculates a shift amount from a unit center point to the element point of the linear structure closest to the unit center point, for each unit obtained by dividing the feature map into a plurality of the units including regions having a predetermined size in a grid pattern.

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