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US Patent 11965993 Measurement and imaging instruments and beamforming method

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
August 5, 2021
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Date of Patent
April 23, 2024
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Patent Application Number
17394615
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Patent Citations
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US Patent 7868824 Beamforming apparatus and method
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US Patent 7957609 System for extended high frame rate imaging with limited-diffraction beams
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US Patent 8002705 Continuous transmit focusing method and apparatus for ultrasound imaging system
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US Patent 8211019 Clinical apparatuses
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US Patent 8499634 Transducer array imaging system
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US Patent 9084559 Imaging method, displacement measurement method and apparatus
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US Patent 9424665 System and method for signals transmission in complex scattering environments using interaction of the waves with a nonlinear object
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US Patent 9326748 Clinical apparatuses
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US Patent 11547386 Method and apparatus for multi-zone, multi-frequency ultrasound image reconstruction with sub-zone blending
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US Patent 7690838 Thermal properties measurement apparatus
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•••
Patent Inventor Names
Chikayoshi Sumi
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Naoto Yamazaki
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11965993
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Patent Primary Examiner
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Peter M Bythrow
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CPC Code
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G01S 7/52019
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G01S 7/52023
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G01S 7/52025
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G01S 7/52033
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G01S 7/52038
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G01S 7/52041
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G01S 7/52046
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G01S 7/52047
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G01S 15/89
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G01S 15/8915
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