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US Patent 11967060 Wafer level spatial signature grouping using transfer learning
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Patent
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Date Filed
August 17, 2021
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Date of Patent
April 23, 2024
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Patent Application Number
17405014
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Patent Citations
US Patent 10360477 Accelerating semiconductor-related computations using learning based models
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US Patent 10713534 Training a learning based defect classifier
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Patent Inventor Names
Alán Dávila
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Osamu Yamamoto
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Narayani Narasimhan
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Ski Sim
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P. Jithendra Kumar Reddy
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
11967060
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Patent Primary Examiner
Sang H Nguyen
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CPC Code
G06V 10/764
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G06N 20/00
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G06T 7/0004
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G06T 2207/20084
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G06T 2207/30148
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G06T 2207/20081
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