US Patent 11971251 Building inspection and measurement device

An inspection and measurement device includes a body defining a first planar face within a first bounded area, a first reference feature disposed on the first planar face within the first bounded area and corresponding with a first measurable parameter for structural inspection, and a second reference feature disposed on the first planar face within the first bounded area and corresponding with a second measurable parameter for structural inspection. The first and second reference features are positioned within the first bounded area for placement adjacent an element bearing the respective one of the first and second measurable parameters, and the first and second reference features overlap within the first bounded area in at least one direction.