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US Patent 11980491 Automatic recognition method for measurement point in cephalo image

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Is a

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Patent attributes

Patent Jurisdiction

United States Patent and Trademark Office

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Patent Number

Patent Inventor Names

Chonho Lee0

Chihiro Tanikawa0

Date of Patent

May 14, 2024

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Patent Application Number

172806980

Date Filed

September 24, 2019

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Patent Citations

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US Patent 10990849 Sample screening method and apparatus, and service object data searching method and apparatus

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Patent Primary Examiner

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CPC Code

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G06T 2207/10116

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G06T 2207/20076

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G06T 2207/20081

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G06T 2207/20084

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G06T 2207/30036

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0

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Patent abstract

A technique for automating the identifying of a measurement point in cephalometric image analysis is provided. An automatic measurement point recognition method includes a step of detecting, from a cephalometric image

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