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US Patent 11987005 Build plane measurement systems and related methods

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
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Date Filed
November 16, 2020
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Date of Patent
May 21, 2024
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Patent Application Number
17098625
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Patent Citations
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US Patent 8598523 Electron beam layer manufacturing using scanning electron monitored closed loop control
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US Patent 8395785 Hybrid sensor
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US Patent 10456984 Adaptive material deposition for additive manufacturing
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US Patent 7625198 Modular fabrication systems and methods
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US Patent 8243289 System and method for dynamic windowing
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Patent Inventor Names
Rachel Wyn Levine
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Fabian Zeulner
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Mackenzie Ryan Redding
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11987005
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Patent Primary Examiner
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Ryan M Ochylski
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CPC Code
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B33Y 30/00
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B33Y 50/00
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B33Y 50/02
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B33Y 10/00
0
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B29C 64/393
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B29C 64/245
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B29C 64/153
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