US Patent 11996884 Dual marker based latency measurement
Patent 11996884 was granted and assigned to Infinera on May, 2024 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
November 15, 2021
0
Date of Patent
May 28, 2024
0
Patent Applicant
Patent Application Number
17527102
0
Patent Inventor Names
Vinod Narippatta
0
Ting-Kuang Chiang
0
Tulasi Veguru
0
Scott Pringle
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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