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US Patent 12002652 Variable mode plasma chamber utilizing tunable plasma potential
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Patent
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Date Filed
November 29, 2021
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Date of Patent
June 4, 2024
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Patent Application Number
17536733
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Patent Citations
US Patent 11255606 Gas flow control for millisecond anneal system
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US Patent 11348767 Plasma processing apparatus having a focus ring adjustment assembly
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US Patent 11348784 Enhanced ignition in inductively coupled plasmas for workpiece processing
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US Patent 11387111 Processing of workpieces with reactive species generated using alkyl halide
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US Patent 11387115 Silicon mandrel etch after native oxide punch-through
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US Patent 11495437 Surface pretreatment process to improve quality of oxide films produced by remote plasma
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US Patent 6974550 Apparatus and method for controlling the voltage applied to an electrostatic shield used in a plasma generator
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US Patent 7100532 Plasma production device and method and RF driver circuit with adjustable duty cycle
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US Patent 7232767 Slotted electrostatic shield modification for improved etch and CVD process uniformity
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US Patent 7426900 Integrated electrostatic inductive coupling for plasma processing
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•••
Patent Inventor Names
Stephen E. Savas
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Shawming Ma
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
12002652
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Patent Primary Examiner
Srinivas Sathiraju
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