Is a
Patent attributes
Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Lee D. Whetsel0
Date of Patent
June 11, 2024
0Patent Application Number
182083660
Date Filed
June 12, 2023
0Patent Citations
Patent Primary Examiner
Patent abstract
This disclosure describes a test architecture that supports a common approach to testing individual die and dies in a 3D stack arrangement. The test architecture uses an improved TAP design to facilitate the testing of parallel test circuits within the die.
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