Patent attributes
A system may measure a response associated with a sample to an excitation. The system may compute, using the measured response and the excitation as inputs to an inverse model or a predetermined predictive model, model parameters on a voxel-by-voxel basis in a forward model with multiple voxels that represent the sample. The predetermined predictive model was trained using training data for different excitation strengths, different measurement conditions, or both. The forward model may simulate response physics occurring within the sample to a given excitation, and the model parameters may include magnetic susceptibilities of the multiple voxels. Moreover, the system may determine an accuracy of the model parameters by comparing at least the measured response and a calculated predicted value of the response using the forward model, the model parameters and the excitation. When the accuracy exceeds a predefined value, the system may provide the model parameters as an output.
