US Patent 12014660 Method of testing a microdevice in integrated systems
Patent 12014660 was granted and assigned to Vuereal Inc. on June, 2024 by the United States Patent and Trademark Office.
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US Patent 12014660 Method of testing a microdevice in integrated systems
Article
Patent abstract
What is disclosed are structures and methods for testing and repairing emissive display systems. Systems are tested with use of temporary electrodes which allow operation of the system during testing and are removed afterward. Systems are repaired after identification of defective devices with use of redundant switching from defective devices to functional devices provided on repair contact pads.
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Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Gholamreza Chaji0
Date of Patent
June 18, 2024
0Patent Application Number
176882680
Date Filed
March 7, 2022
0Patent Citations
Patent Primary Examiner
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