US Patent 12025649 Integrated circuit die test architecture
Patent 12025649 was granted and assigned to Texas Instruments on July, 2024 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
July 27, 2023
0
Date of Patent
July 2, 2024
0
Patent Applicant
Patent Application Number
18226924
0
Patent Citations
•••
Patent Inventor Names
Lee D. Whetsel
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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