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US Patent 12066409 Testing device

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Is a

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Patent attributes

Patent Jurisdiction

United States Patent and Trademark Office

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Patent Number

Patent Inventor Names

Hideaki Shishido0

Takayuki Ikeda0

Date of Patent

August 20, 2024

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Patent Application Number

172803270

Date Filed

October 1, 2019

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Patent Citations

US Patent 10984703 Semiconductor device, display system which corrects image data, and electronic device

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US Patent 10613206 Ultrasound probe and ultrasound imaging apparatus using the same

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US Patent 10922605 Semiconductor device and electronic device

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US Patent 8519990 Semiconductor display device

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US Patent 10002656 Semiconductor device and electronic device

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Patent Primary Examiner

Giovanni Astacio-Oquendo

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Patent abstract

A cost of a testing device is reduced. A structure of a testing device is simplified. A testing device capable of testing with higher accuracy is provided. A testing device (

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