Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Philipp Kukura0
Sanli Faez0
Date of Patent
August 27, 2024
0Patent Application Number
174409450
Date Filed
March 12, 2020
0Patent Citations
Patent Primary Examiner
Patent abstract
A scattering microscopy arrangement uses a microscope to image an object comprising a surface. A light source emits illuminating light and a light detector detects light elastically scattered from the object. An electric potential is applied to the surface that affects the electrochemical properties of the object while imaging. The electric potential provides a contrast mechanism that improves the imaging and allows for characterisation of the object and/or the surrounding environment.
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