US Patent 12085512 Processing method and processing device

A processing method includes obtaining a processing image of a apparatus and performing a second processing on the processing image to generate a target image to analyze the target image according to a target defect detection method to realize defect detection of the apparatus. The processing image is obtained by performing a first processing on an initial image of the apparatus. The first processing includes performing scale processing on the initial image according to defect parameters corresponding to the initial image.