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US Patent 12092582 Optical inspection device

Overview Structured Data Issues Contributors Activity

Is a

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Patent attributes

Patent Jurisdiction

United States Patent and Trademark Office

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Patent Number

Patent Inventor Names

Takashi Usui0

Hiroshi Ohno0

Date of Patent

September 17, 2024

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Patent Application Number

170069350

Date Filed

August 31, 2020

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Patent Citations

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US Patent 10866186 System and method for focusing color Schlieren diagnostics

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US Patent 11115573 Hyperspectral plenoptic camera

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Patent Primary Examiner

Gordon J Stock, Jr.

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CPC Code

0

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Patent abstract

An optical inspection device

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