US Patent 12107556 Fault detection in integrated circuits
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US Patent 12107556 Fault detection in integrated circuits
Article
Patent abstract
An integrated circuit includes a transimpedance amplifier and an injection circuit. The injection circuit generates a first electrical test signal and injects the first electrical test signal into the transimpedance amplifier. The first electrical test signal or an output of the transimpedance amplifier generated based on the first electrical test signal is used to determine whether the integrated circuit is faulty.
Infobox
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Patent Jurisdiction
Patent Number
Patent Inventor Names
Alexander C. Kurylak0
Kadaba Lakshmikumar0
Sanjay Sunder0
Date of Patent
October 1, 2024
0Patent Application Number
174488220
Date Filed
September 24, 2021
0Patent Citations
Patent Primary Examiner
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