Patent attributes
A modular vertical probe card having different probes is provided, and includes a first guiding board unit, a second guiding board unit, and a plurality of conductive probes that pass through the first and the second guiding board units. The conductive probes have a same probe length. Each of the conductive probes includes a stroke segment located between the first guiding board unit and the second guiding board unit, a connection segment, and a testing segment, the latter two of which are respectively connected to two ends of the stroke segment. The stroke segments of the conductive probes have N number of shapes different from each other to allow the conductive probes to have a same contact force and to be configured to meet N number of electrical transmission requirements different from each other, in which N is a positive integer greater than one.
