US Patent 12119073 Integrated circuit and operation method and inspection method thereof

The disclosure provides an integrated circuit and an operation method and an inspection method thereof. The integrated circuit includes a one-time programmable (OTP) memory, an identifier generation circuit, and a memory controller. The identifier generation circuit generates a random number, and performs an error-detection-code encoding operation on the random number to generate an identifier with an error-detection code. The memory controller writes the identifier generated by the identifier generation circuit into the OTP memory. The identifier generation circuit reads the identifier from the OTP memory through the memory controller, and performs an error-detection-code decoding operation on the identifier provided by the memory controller to determine whether an error of the identifier from the OTP memory is correctable. When it is determined that the error of the identifier from the OTP memory is not correctable, the writing of the identifier is deemed failed.