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US Patent 12124590 Testing device, testing method, and testing program

Patent 12124590 was granted and assigned to Nippon Telegraph and Telephone on October, 2024 by the United States Patent and Trademark Office.

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Patent

Patent attributes

Patent Applicant

Nippon Telegraph and Telephone

Current Assignee

Nippon Telegraph and Telephone

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

121245900

Patent Inventor Names

Hiroshi Kurakami0

Date of Patent

October 22, 2024

Patent Application Number

177730390

Date Filed

November 11, 2019

Patent Citations

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Patent Primary Examiner

CPC Code

Patent abstract

A testing device (

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