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US Patent 6848500 Cooling system for pulsed power electronics

Patent 6848500 was granted and assigned to Skyworks Solutions on February, 2005 by the United States Patent and Trademark Office.

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Is a
Patent
Patent
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Patent attributes

Patent Applicant
0
Current Assignee
Skyworks Solutions
Skyworks Solutions
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
68485000
Patent Inventor Names
Abdolreza Langari0
Seyed Hassan Hashemi0
Date of Patent
February 1, 2005
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Patent Application Number
092663760
Date Filed
March 11, 1999
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Patent Citations Received
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US Patent 12068223 Method of constructing a circuitry assembly for heat dispersal using a phase change material
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Patent Primary Examiner
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Christopher Atkinson
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Patent abstract

The invention discloses an apparatus for reducing peak temperatures and thermal excursions, of semiconductor devices, particularly in pulsed power applications. The apparatus comprises thermally coupling Phase Change Material (PCM) to the dissipating semiconductor device. PCM absorbs heat and stays at a constant temperature during its phase change from solid to liquid. The PCM melting point is chosen so that it is just below the temperature the device would otherwise achieve. When the device approaches the maximum temperature, the PCM melts, drawing heat from the device and lowering the device's peak temperature. As the device stops dissipating, after its pulse period, the PCM material solidifies releasing the heat it absorbed. The apparatus lowers the peak temperature by absorbing heat when the device is dissipating. The apparatus also keeps the semiconductor device from cooling off as much as it would cool without the apparatus, as the PCM material releases heat during the part of the cycle when it is re-solidifying, i.e. when the pulse power is off. By lowering the peak temperature the device achieves, and increasing the temperature of the device when it is in the off portion of its pulsed power cycle the temperature excursions of the device during operation are reduced. By reducing the temperature swings, that the device sees during operation, the thermal stress is reduced and the reliability of the device is improved.

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