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US Patent 6986636 Device for positioning disk-shaped objects

Patent 6986636 was granted and assigned to Brooks Automation on January, 2006 by the United States Patent and Trademark Office.

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Is a
Patent
Patent
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Patent attributes

Current Assignee
Brooks Automation
Brooks Automation
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
69866360
Patent Inventor Names
Joachim Konig0
Bjorn Zimmer0
Manfred Heinze0
Steffen Kruger0
Date of Patent
January 17, 2006
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Patent Application Number
102974850
Date Filed
May 10, 2001
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Patent Citations Received
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US Patent D1023984 Gripper for wafer cassette
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0
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US Patent D1046798 Gripper for semiconductor wafer housing cassette
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Patent Primary Examiner
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Khoi H Tran
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Patent abstract

A device for positioning disk-shaped objects (1) to inspect the front and rear sides of disk-shaped objects and to reduce the negative effect of large-area contact between the holder and the disk-shaped object. The device comprises a rotatable table (24) which can be adjusted in the x-y direction in an adjustment plane and is intended to accomodate a platform (3). A fork-shaped frame (8) is mounted on the platform so as to be rotatable about an axis of rotation which is aligned perpendicular to the surface of the platform (3) and the angle of tilt of which can be set relative to the adjustment plane. At its fork ends, the fork-shaped frame (8) has another axis of rotation which is aligned perpendicular to the axis of rotation of the fork-shaped frame (8) and about which a frame-shaped object holder (9) is mounted so as to be rotatable in the fork-shaped frame (8) for the purpose of turning the object. The frame-shaped object holder (9), which carries the object in the edge region of the latter, surrounds a center through which passes a pivoting axis aligned parallel to the adjustment plane and intended for setting the angle of tilt of the second axis of rotation relative to the adjustment plane. Devices of this kind can be used to position flat objects in space for purposes of inspecting semiconductor wafers or flat panels.

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