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US Patent 7042240 Burn-in testing apparatus and method

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
February 28, 2005
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Date of Patent
May 9, 2006
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Patent Application Number
11069589
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Patent Citations Received
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US Patent 11940487 Thermal solution for massively parallel testing
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US Patent 11835549 Thermal array with gimbal features and enhanced thermal performance
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US Patent 11841392 Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
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US Patent 11852678 Multi-input multi-zone thermal control for device testing
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US Patent 12078672 Heat spreaders for use in semiconductor device testing, such as burn-in testing
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US Patent 12061227 Integrated heater and temperature measurement
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Patent Inventor Names
Brian J. Denheyer
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Christopher A. Lopez
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Gordon B. Kuenster
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
7042240
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Patent Primary Examiner
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Vinh Nguyen
0

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