Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Hideto Ohnuma0
Hisashi Ohtani0
Shunpei Yamazaki0
Date of Patent
July 4, 2006
0Patent Application Number
097616410
Date Filed
January 18, 2001
0Patent Citations Received
Patent Primary Examiner
Patent abstract
There is provided a method of manufacturing a semiconductor device having a TFT with sufficient characteristics and little fluctuation by accurately controlling the addition amount of impurity ions to the semiconductor layer using an ion doping device. A semiconductor device having a TFT showing sufficient and stable characteristics may be obtained by increasing the ratio of the dopant amount in the doping gas and decreasing the ambient atmosphere components (C, N, O) and hydrogen to be simultaneously added with the impurity ions at the time of doping.
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