Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Victor B. Kley0
Date of Patent
August 15, 2006
0Patent Application Number
100474540
Date Filed
January 14, 2002
0Patent Primary Examiner
Patent abstract
A scanning probe microscope assembly that has an atomic force measurement (AFM) mode, a scanning tunneling measurement (STM) mode, a near-field spectrophotometry mode, a near-field optical mode, and a hardness testing mode for examining an object.
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