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US Patent 7107114 Manufacturing system, measurement data collecting system, and measurement terminal apparatus

Patent 7107114 was granted and assigned to Seiko Epson on September, 2006 by the United States Patent and Trademark Office.

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Patent abstract

A manufacturing system has an inspection data collecting apparatus that is capable of carrying out, upon receipt of a signal containing measurement data in different formats according to the type of inspection or a measuring instrument, processing in accordance with the signal and the format of data to create data in a certain format, and of transmitting a signal for giving an instruction to the measuring instrument in association with the format compatible with the measuring instrument. All data obtained by the inspections in all steps for manufacturing a product is accumulate as inspection data and exchanged among the steps.

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