Patent 7111261 was granted and assigned to Micron Technology on September, 2006 by the United States Patent and Trademark Office.
The present invention relates to a characterizing a timing delay curve of a circuit component, said timing delay curve having a first region and a second region. The method includes determining a first delay equation representing the first region of the delay curve, determining a second delay equation representing the second region of the delay curve, and determining a corner capacitance representing a transition point from the first region to the second region.