US Patent 7112979 Testing arrangement to distribute integrated circuits

Patent 7112979 was granted and assigned to Intel on September, 2006 by the United States Patent and Trademark Office.

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Patent Number

Date of Patent

September 26, 2006

Patent Application Number

10278021

Date Filed

October 23, 2002

Patent Primary Examiner

Patent abstract

Arrangements having integrated circuit (IC) voltage and thermal resistance designated on a per IC basis.

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