US Patent 7129696 Method for capacitance measurement in silicon
Patent 7129696 was granted and assigned to Texas Instruments on October, 2006 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
November 22, 2004
0
Date of Patent
October 31, 2006
0
Patent Application Number
10994831
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Patent Inventor Names
Nagaraj Narasimh Savithri
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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