Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Mike R. Moran0
Uday R. Savagaonkar0
Date of Patent
October 31, 2006
0Patent Application Number
107267470
Date Filed
December 2, 2003
0Patent Primary Examiner
Patent abstract
The invention(s) relates to a wafer test system including a circuit to communicate an overdrive to a chuck, the chuck moving a wafer towards a probe head responsive to the overdrive, a circuit to measure a contact resistance of at least one channel in each of a plurality of dies associated with the wafer using the probe head, a circuit to compute a per channel standard deviation responsive to measuring the contact resistance, a circuit to compare the standard deviation on the at least one channel to a threshold, and a circuit to increase the overdrive responsive to the comparison.
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