US Patent 7132650 High throughput multi-dimensional sample analysis
Is a
Date Filed
September 25, 2004
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Date of Patent
November 7, 2006
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Patent Application Number
10951255
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Patent Citations Received
Patent Inventor Names
Matthew M. Gregori
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Bruce Wilcox
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Ronald C. Gamble
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Stephen D. O'Connor
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Patent Jurisdiction
Patent Number
Patent Primary Examiner
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