US Patent 7146539 Systems and methods for testing a device-under-test
Patent 7146539 was granted and assigned to Verigy on December, 2006 by the United States Patent and Trademark Office.
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Patent Inventor Names
Andrew S. Hildebrant0
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Patent abstract
A method for testing a device-under-test (DUT) includes examining a test data file that includes test data for testing the structure, functionality and/or performance of the DUT. The method also includes separating a first plurality of data units from a second plurality of data units contained in the test data file. The first plurality of data units correspond to a first plurality of DUT pins, and the second plurality of data units correspond to a second plurality of DUT pins.
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US Patent 07146539 Systems and methods for testing a device-under-test US Patent 7146539 Systems and methods for testing a device-under-test
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Patent Number
071465390
Patent Number
71465390
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Patent Jurisdiction
Patent Number
071465390
Date of Patent
December 5, 2006
0Patent Application Number
106201910
Date Filed
July 15, 2003
0Official Website
Patent Primary Examiner
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US Patent 07146539 Systems and methods for testing a device-under-test
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Is a
Current assignee
Patent jurisdiction
Patent number
07146539
Date of patent
December 5, 2006
Patent application number
10620191
Date Filed
July 15, 2003
Patent primary examiner
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