US Patent 7161363 Probe for testing a device under test
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Patent abstract
A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
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US Patent 07161363 Probe for testing a device under test US Patent 7161363 Probe for testing a device under test
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Patent Number
0716136300
Patent Number
716136300
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Is a
Patent Jurisdiction
Patent Number
071613630
Date of Patent
January 9, 2007
0Patent Application Number
108487770
Date Filed
May 18, 2004
0Official Website
Patent Primary Examiner
Edits on 23 Sep, 2022
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Infobox
Is a
Patent Jurisdiction
Patent Number
071613630
Date of Patent
January 9, 2007
0Patent Application Number
108487770
Date Filed
May 18, 2004
0Official Website
Patent Primary Examiner
Edits on 8 Jun, 2022
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US Patent 07161363 Probe for testing a device under test
Infobox
Is a
Patent jurisdiction
Patent number
07161363
Date of patent
January 9, 2007
Patent application number
10848777
Date Filed
May 18, 2004
Patent primary examiner
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