Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
William R. Wheeler0
Hung Phi Nguyen0
Rusmin Kudinar0
Steven W. Meeks0
Date of Patent
January 9, 2007
0Patent Application Number
111965400
Date Filed
August 3, 2005
0Patent Primary Examiner
Patent abstract
In one embodiment, a surface analyzer system comprises a radiation targeting assembly to target a radiation beam onto a surface; and a reflected radiation collecting assembly that collects radiation reflected from the surface, wherein the reflected radiation collecting assembly comprises a mirror to collect radiation reflected from the surface.
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