Patent 7164122 was granted and assigned to Ionwerks, Inc. on January, 2007 by the United States Patent and Trademark Office.
The present invention relates to an improved ion mobility spectrometer and method for the analysis of chemical samples. The improvements are realized in the optimization of resolution and sensitivity. Increases in sensitivity are realized by preserving a narrow spatial distribution of migrating ions through the use of periodic/hyperbolic field focusing. Use of a plurality of drift cells and a new RF field focusing interface are discussed.