US Patent 7174233 Quality/reliability system and method in multilevel manufacturing environment

Overview Structured Data Issues Contributors Activity

Is a

Patent

Patent attributes

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

71742330

Patent Inventor Names

Shu Chen Lim0

John S. Maresca0

Michael W. Bolch0

Paul A. Zulpa0

Biao Cai0

Edmund Blackshear0

Eric T. Lambert0

George M. Hurtis0

Date of Patent

February 6, 2007

Patent Application Number

111621040

Date Filed

August 29, 2005

Patent Primary Examiner

‌

Leo Picard

Patent abstract

This is a system and method for management system. The system and method includes a raw pull indicator database which receives inputs comprising data from participant nodes. A system comprises execution logic which operates on the data from the raw pull indicator. A disposition system feedbacks reliability data of the participants based on the data operated on by the system.

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