US Patent 7176702 Contact system for wafer level testing
Patent 7176702 was granted and assigned to Micron Technology on February, 2007 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
April 7, 2004
0
Date of Patent
February 13, 2007
0
Patent Application Number
10819673
0
Patent Inventor Names
Daniel P. Cram
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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