Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Visvamohan Yegnashankaran0
Hengyang Lin0
Date of Patent
March 6, 2007
0Patent Application Number
109022310
Date Filed
July 29, 2004
0Patent Primary Examiner
Patent abstract
An integrated circuit test method is provided that utilizes shared tester resources physically located at different geographical sites throughout the world to test specific integrated circuits, thereby maximizing utilization of all tester resources and, thereby, dramatically reducing the overall cost to test.
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