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US Patent 7202953 Scanning microscopic method having high axial resolution

Patent 7202953 was granted and assigned to Evotec on April, 2007 by the United States Patent and Trademark Office.

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Patent

Patent attributes

Current Assignee
Evotec
Evotec
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7202953
Date of Patent
April 10, 2007
Patent Application Number
09868845
Date Filed
December 21, 1999
Patent Primary Examiner
‌
Gregory J. Toatley, Jr
Patent abstract

The invention relates to a method for optically detecting at least one entity which is arranged on a substrate. The at least one entity is scanned with a measuring volume using at least one radiation source and a confocal optic. During a scanning process an auxiliary focus is generated by means of at least one second radiation source and a second optic. Radiation generated by the first radiation source is collimated by a first optic and radiation generated by the second radiation source is collimated by a second optic. A retroreflection from the auxiliary focus is detected by at least one detector and is used to measuring the position of an interface and, thus, for indirectly positioning the measuring volume. The position of the auxiliary focus relative to the measuring volume is adjustable in a defined manner.

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