US Patent 7218324 Scene reflectance functions under natural illumination

A method and system estimates a reflectance function of an arbitrary scene. The scene is illuminated under various lighting condition. For each lighting condition there is an associated illumination image and an observed image. Multiple, non-overlapping kernels are determined for each pixel in a reflectance image from the pairs of illumination and observed images. A weight is then determined for each kernel to estimate the reflectance function represented as the reflectance image.