US Patent 7221212 Trimming functional parameters in integrated circuits

A trimming structure for trimming functional parameters of an Integrated Circuit—IC—(100) includes a first (115a) and at least one second functional blocks (115b, . . . ,115n) with which a first (Vrg,a) and at least one second IC functional parameters (Vrg,b, . . . ,Vrg,n) are respectively associated. The trimming structure includes respective trimmable circuit structures (205a,210a, . . . ,205n,210n) included in the first and at least one second functional blocks, and trimming configuration storage (110) for storing trimming configurations for the trimmable circuit structures. A change in the trimming configuration of the first functional block causes a corresponding change in the trimming configuration of the second functional block. Further, a change in the second IC functional parameter in response to the corresponding change in the trimming configuration of the second functional block is proportional to the change in the first IC functional parameter consequent to the change in the trimming configuration of the first functional block.