Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Hirokazu Yonezawa0
Date of Patent
May 22, 2007
0Patent Application Number
111015720
Date Filed
April 8, 2005
0Patent Primary Examiner
Patent abstract
A timing analysis apparatus reads a net list including connection information and the like of circuit cells of an LSI, delay data for previously storing delay information of the circuit cells, stage count-derating factor dependency and components P, V and T of a derating factor; detects the number of stages of each signal path by a signal path cell counting section; determines a derating factor corresponding to the extent of averaging of random variation of each signal path in accordance with the number of stages of the signal path; and performs timing analysis on the basis of the determined derating factor. Therefore, more realistic and highly accurate timing design can be performed on a large-scale circuit.
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