US Patent 7231320 Extraction of imperfection features through spectral analysis
Is a
Date Filed
March 14, 2005
Date of Patent
June 12, 2007
Patent Application Number
11079745
Patent Inventor Names
Stylianos Papadimitriou
0
Wanda G. Papadimitriou
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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