US Patent 7233395 Performing retardation measurements

Patent 7233395 was granted and assigned to Georgia Tech Research Corporation on June, 2007 by the United States Patent and Trademark Office.

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Patent Inventor Names

Carole C. Montarou0

Thomas K. Gaylord0

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Patent abstract

Systems and methods of measuring birefringence or retardation are provided. For some embodiments, a system is provided, which comprises a polarizer, an analyzer, a first waveplate, and a second waveplate. The system is configured to obtain light intensity measurements by recursively rotating the second waveplate. The obtained light intensity measurements are retrieved, and a light transmission intensity curve is determined from the light intensity measurements.

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Official Website

https://pdfpiw.uspto.gov/.piw?Docid=07233395

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