Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Edward G. Wenski0
Date of Patent
July 17, 2007
0Patent Application Number
112291110
Date Filed
September 16, 2005
0Patent Primary Examiner
Patent abstract
A micro-tensile testing system providing a stand-alone test platform for testing and reporting physical or engineering properties of test samples of materials having thicknesses of approximately between 0.002 inch and 0.030 inch, including, for example, LiGA engineered materials. The testing system is able to perform a variety of static, dynamic, and cyclic tests. The testing system includes a rigid frame and adjustable gripping supports to minimize measurement errors due to deflection or bending under load; serrated grips for securing the extremely small test sample; high-speed laser scan micrometers for obtaining accurate results; and test software for controlling the testing procedure and reporting results.
Timeline
No Timeline data yet.
Further Resources
No Further Resources data yet.